Thermal Diffusivity Measurements of Metal Thin Films by Means of the Picosecond Thermoreflectance Technique

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Periodical:

Edited by:

Keizo Uematsu and Harumi Yokokawa

Pages:

215-224

DOI:

10.4028/www.scientific.net/KEM.253.215

Citation:

N. Taketoshi et al., "Thermal Diffusivity Measurements of Metal Thin Films by Means of the Picosecond Thermoreflectance Technique", Key Engineering Materials, Vol. 253, pp. 215-224, 2003

Online since:

November 2003

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$35.00

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