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HomeKey Engineering MaterialsKey Engineering Materials Vol. 253Thermal Diffusivity Measurements of Metal Thin...

Thermal Diffusivity Measurements of Metal Thin Films by Means of the Picosecond Thermoreflectance Technique

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Ceramic Interfaces: Properties and Applications V

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Periodical:

Key Engineering Materials (Volume 253)

Pages:

215-224

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.253.215

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Online since:

November 2003

Authors:

Naoyuki Taketoshi, Tetsuya Baba, Akira Ono

Keywords:

Picosecond Thermoreflectance, Thermal Diffusivity, Thermophysical Property, Thin Film

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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