Commercial Silicon Nitride Powders Surface Groups Measured by Diffuse Reflectance Infrared Fourier Transform Spectroscopy

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Periodical:

Key Engineering Materials (Volumes 264-268)

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Edited by:

Hasan Mandal and Lütfi Öveçoglu

Pages:

1119-1122

DOI:

10.4028/www.scientific.net/KEM.264-268.1119

Citation:

T.T.T. Hien et al., "Commercial Silicon Nitride Powders Surface Groups Measured by Diffuse Reflectance Infrared Fourier Transform Spectroscopy ", Key Engineering Materials, Vols. 264-268, pp. 1119-1122, 2004

Online since:

May 2004

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