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HomeKey Engineering MaterialsKey Engineering Materials Vols. 264-268Commercial Silicon Nitride Powders Surface Groups...

Commercial Silicon Nitride Powders Surface Groups Measured by Diffuse Reflectance Infrared Fourier Transform Spectroscopy

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Euro Ceramics VIII

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Periodical:

Key Engineering Materials (Volumes 264-268)

Pages:

1119-1122

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.264-268.1119

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Online since:

May 2004

Authors:

T.T.T. Hien, C. Ishizaki, Kozo Ishizaki

Keywords:

Commercial Silicon Nitride, Diffuse Reflectance Infrared Fourier Transform (DRIFT) Spectroscopy , NH_x, OH, Powder, SiH_x Absorbance Bands

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[1] (2003), pp.28-32.

[2] T. T. T. Hien, Ch. Ishizaki and K. Ishizaki: SiHx Absorbance Bands in Si3N4 Powders Analyzed by Diffuse Reflectance Infrared Fourier Transform Spectroscopy, submitted in J. Ceram. Soc. Jpn, (2003).

DOI: 10.2109/jcersj.112.1

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[5] T. Nakamatsu, N. Saito, Ch. Ishizaki and K. Ishizaki: J. Euro. Ceram. Soc., Vol. 18 (1998), pp.1273-1279.

[6] E. Busterret, M. Bensouda, M. C. Habrard, J. C. Bruyere, S. Poulin and S. C. Gujrathi: Physical Review B, Vol. 38.

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