X-Ray Stress and Diffraction Line Width Measurement by the Gaussian Curve and Parabola Methods

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Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

126-132

DOI:

10.4028/www.scientific.net/KEM.270-273.126

Citation:

Z. W. Liu and M. Kurita, "X-Ray Stress and Diffraction Line Width Measurement by the Gaussian Curve and Parabola Methods ", Key Engineering Materials, Vols. 270-273, pp. 126-132, 2004

Online since:

August 2004

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Price:

$35.00

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