Analysis of Beta-Ray Data Using the Wavelet Thresholding Method and Extended Kalman Filter

Sung Hwan Han; Hyeon Ho Kim; Hyeon Deok Bae

doi:10.4028/www.scientific.net/KEM.270-273.174

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Analysis of Beta-Ray Data Using the Wavelet Thresholding Method and Extended Kalman Filter
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 270-273Analysis of Beta-Ray Data Using the Wavelet...

Analysis of Beta-Ray Data Using the Wavelet Thresholding Method and Extended Kalman Filter

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Key Engineering Materials (Volumes 270-273)

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174-179

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.270-273.174

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Online since:

August 2004

Authors:

Sung Hwan Han, Hyeon Ho Kim, Hyeon Deok Bae

Keywords:

Extended Kalman Flter (EKF), PM₁₀, Poisson Process, Wavelet Thresholding Method

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