Analysis of Beta-Ray Data Using the Wavelet Thresholding Method and Extended Kalman Filter

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Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

174-179

Citation:

S. H. Han et al., "Analysis of Beta-Ray Data Using the Wavelet Thresholding Method and Extended Kalman Filter ", Key Engineering Materials, Vols. 270-273, pp. 174-179, 2004

Online since:

August 2004

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$38.00

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