Study of Ti3Si1.2-xAlxC2 (x = 0~1.2) Solid Solution via X-Ray Diffraction

Cui Wei Li; Hong Xiang Zhai; Yan Ding; Yang Zhou; Shi Bo Li; Zhi Li Zhang

doi:10.4028/www.scientific.net/KEM.336-338.952

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 336-338Study of Ti3Si1.2-xAlxC2 (x = 0~1.2) Solid...

Study of Ti₃Si_1.2-xAl_xC₂ (x = 0~1.2) Solid Solution via X-Ray Diffraction

Abstract:

A search for Ti3Si1.2-xAlxC2 (x=0~1.2) solid solution was undertaken using precise X-ray diffraction measurements. The samples covering the whole concentration range were studied. Except very ends of the concentration range, the samples contained two phases, identified as Ti3Si1.2-xAlxC2 solid solution and TiC respectively. Lattice parameter, a increased, c increased, c/a increased, and cell volume increased with the increasing of Al concentration.