Study of Ti3Si1.2-xAlxC2 (x = 0~1.2) Solid Solution via X-Ray Diffraction
A search for Ti3Si1.2-xAlxC2 (x=0~1.2) solid solution was undertaken using precise X-ray diffraction measurements. The samples covering the whole concentration range were studied. Except very ends of the concentration range, the samples contained two phases, identified as Ti3Si1.2-xAlxC2 solid solution and TiC respectively. Lattice parameter, a increased, c increased, c/a increased, and cell volume increased with the increasing of Al concentration.
Wei Pan and Jianghong Gong
C. W. Li et al., "Study of Ti3Si1.2-xAlxC2 (x = 0~1.2) Solid Solution via X-Ray Diffraction", Key Engineering Materials, Vols. 336-338, pp. 952-954, 2007