Study of Ti3Si1.2-xAlxC2 (x = 0~1.2) Solid Solution via X-Ray Diffraction

Abstract:

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A search for Ti3Si1.2-xAlxC2 (x=0~1.2) solid solution was undertaken using precise X-ray diffraction measurements. The samples covering the whole concentration range were studied. Except very ends of the concentration range, the samples contained two phases, identified as Ti3Si1.2-xAlxC2 solid solution and TiC respectively. Lattice parameter, a increased, c increased, c/a increased, and cell volume increased with the increasing of Al concentration.

Info:

Periodical:

Key Engineering Materials (Volumes 336-338)

Edited by:

Wei Pan and Jianghong Gong

Pages:

952-954

DOI:

10.4028/www.scientific.net/KEM.336-338.952

Citation:

C. W. Li et al., "Study of Ti3Si1.2-xAlxC2 (x = 0~1.2) Solid Solution via X-Ray Diffraction", Key Engineering Materials, Vols. 336-338, pp. 952-954, 2007

Online since:

April 2007

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Price:

$35.00

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