Experimental Investigation on Brittle-Ductile Transition in Electroplated Diamond Wire Saw Machining Single Crystal Silicon

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Abstract:

Based on reciprocating electroplated diamond wire saw (REDWS) slicing experiments, a study on REDWS machining brittle-ductile transition of single crystal silicon was introduced. The machined surfaces and chips were observed by using Scanning Electron Microscope (SEM), and some experimental evidences of the change of material removal mode had been obtained. The experimental results indicate there is a close relationship between material removal mode and the ratio r value of ingot feed speed and wire speed, through controlling and adjusting the r value, the material removal mode can be complete brittle, partial ductile and near-ductile removal.

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Key Engineering Materials (Volumes 431-432)

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265-268

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Online since:

March 2010

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© 2010 Trans Tech Publications Ltd. All Rights Reserved

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[1] Y.F. Gao, P.Q. Ge and Z.J. Hou: Key Engineering Materials, Vols. 359-360 (2008), pp.450-454.

Google Scholar

[2] C.W. Hardin, J. Qu and A.J. Shih: Materials and Manufacturing Process, Vols. 19 (2004) No. 2, pp.355-367.

Google Scholar

[3] H.M. Wang, and Z.S. Lu: Key Engineering Materials, Vols. 375-376 (2008), pp.11-16.

Google Scholar

[4] K. Liu, X.P. Li, M. Rahman, X.D. Liu and L.C. Lee: Electronics Packaging Technology Conference (Singapore, December 10-12, 2002), pp.200-205.

Google Scholar

[5] W.C.D. Cheong and L.C. Zhang: Nanotechnology, Vols. 11 (2000), pp.173-180. Lamellar chips.

Google Scholar