The Kelvin Probe Force Microscopy Measurement of Degraded Multilayer Ceramic Capacitors with Ni Inner Electrode

Takafumi Okamoto; Noriyuki Inoue; Shuji Kitagawa; Hideaki Niimi; Akira Ando; Hiroshi Takagi

doi:10.4028/www.scientific.net/KEM.485.47

Paper Titles

Relaxor Characteristics of BaTiO₃-Bi(Mg_1/2Ti_1/2)O₃ Ceramics
p.31

Preparation and Dielectric Properties of Dense Barium Titanate Nanoparticle Accumulations by Electrophoresis Deposition Method
p.35

Preparation of Potassium Niobate–Barium Titanate Ceramics Using Well-Dispersed Nanoparticles and their Dielectric Properties
p.39

Kinetics of Oxygen Diffusion into Multilayer Ceramic Capacitors during the Re-Oxidation Process and its Implications on Dielectric Properties
p.43

The Kelvin Probe Force Microscopy Measurement of Degraded Multilayer Ceramic Capacitors with Ni Inner Electrode
p.47

High-Temperature Depolarization of Alkali Niobate Lead-Free Piezoceramics
p.53

Piezoelectric Properties of (Li, Na, K)NbO₃ Ceramics with Monoclinic System
p.57

Piezoelectric Properties of Porous Potassium Niobate System Ceramics
p.61

Piezoelectric Properties and Enhancement of Moisture-Resistance of K_0.5Na_0.5NbO₃ by Adding ZnO-Based Glass
p.65

HomeKey Engineering MaterialsKey Engineering Materials Vol. 485The Kelvin Probe Force Microscopy Measurement of...

The Kelvin Probe Force Microscopy Measurement of Degraded Multilayer Ceramic Capacitors with Ni Inner Electrode

Abstract:

Electric potential mapping of degraded dielectric layers of multilayer ceramic capacitors (MLCCs) was carried out using Kelvin probe force microscopy in order to clarify their degradation mechanism under conditions of an accelerated lifetime test condition. In the cross sections of the degraded and as-prepared dielectric layers, a significant electric field concentration was found in the vicinity of the anode of the degraded dielectric layer, in contrast to a homogeneous concentration found throughout layers of the samples before the accelerated lifetime test.

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Key Engineering Materials (Volume 485)

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47-50

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.485.47

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Online since:

July 2011

Authors:

Takafumi Okamoto, Noriyuki Inoue, Shuji Kitagawa, Hideaki Niimi, Akira Ando, Hiroshi Takagi

Keywords:

Barium Titanate (BT), Electric Potential Mapping, Highly Accelerated Life Time Test (HALT), Insulation Degradation, Kelvin Probe Force Microscopy, Ni-MLCC, Reliability

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