Reliability and Bondability Study on Interfacial Behavior between SnAgCu Solder and Cu-Ni-Au OSP Pads

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In this paper, micro interfacial behavior for Sn3.5Ag0.5Cu (SAC305) lead-free solder on Cu-Ni-Au substrate has been carefully investigated. It is observed that the intermetallic compound (IMC) ingredients along the SAC305 solder on the Cu-Ni-Ag substrate are (Ni, Cu)3Sn4 and (Cu, Ni)6Sn5 after reflow process. Reliability analysis for IMC ((Ni, Cu)3Sn4 and (Cu, Ni)6Sn5) was conducted based on the measurement of IMCs thickness and ball shear force. Temperature effects were also included in the analysis. The ingredients of IMC remain un-change if the working temperature is below 400 OC. Diffusion rate of interfacial controlled reaction was found to be depended on the annealing temperature. The IMC layer thickness decreased as the ramp-up rate of reflow temperature was increased for all cases studies. Preliminary results demonstrated that the measured ball shear force slightly changed for all different IMC thicknesses.

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September 2013

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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