Structure and Dielectric Properties of Mn, Co, and Ni-Doped LaSrFeO3 Films

Bin Fu; Yang Lu Hou; Wei Bing Wu; Xing Hua Fu

doi:10.4028/www.scientific.net/KEM.575-576.499

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 575-576Structure and Dielectric Properties of Mn, Co, and...

Structure and Dielectric Properties of Mn, Co, and Ni-Doped LaSrFeO₃ Films

Abstract:

Mn, Co, and Ni-doped La_0.5Sr_0.5FeO₃ thin films were prepared by the sol-gel technique. The structure and dielectric properties of the films were studied by XRD, SEM, and electrical measurements. The morphology observation demonstrated these films had uniform grain size and smooth surface. The dielectric properties of La_0.5Sr_0.5FeO₃ films were improved by the replacement of Fe with Mn, Co, and Ni. The doping amount of Mn, Co, and Ni for the optimal dielectric properties of La_0.5Sr_0.5FeO₃ films is 5%, 2%, and 3%, respectively. The observed pure perovskite phase of the doped films suggested the dissolution of Mn, Co, and Ni in La_0.5Sr_0.5FeO₃ crystal lattice.

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Key Engineering Materials (Volumes 575-576)

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499-503

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.575-576.499

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Online since:

September 2013

Authors:

Bin Fu, Yang Lu Hou, Wei Bing Wu, Xing Hua Fu

Keywords:

Dielectric Property, La_0.5Sr_0.5FeO₃, Sol-Gel Method, Thin Film

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