Hilbert Curve Fractal Stacking in the Application of Path Planning in the Molten Molding

Abstract:

The scanning process of fused deposition modeling is realizing the fill of certain region, Therefore, reasonable scanning path planning directly affects the forming efficiency and the precision of the work piece. The method of Hilbert curve fractal scanning path which basing on the characteristics of both partition and parallel scanning is put forward basing on the analysis of the existing scanning mode. Application of improved curve filling method for complex curved surface forming planning, according to the characteristics of the Hilbert curve and Hamilton circuit, combined with the characteristics of the scanned level scan path trajectory planning, generate a continuous and comprehensive function value which the weight minimum scanning track under the premise of ensuring the quality of scanning. In order to avoid the generation of island type trajectory, setting a decimal for each loop can easily distinguish between each circuit, finally obtains the scan trajectory. The method can be used to generate scanning track continuous greatly reducing the spray head start and stop times and improves the processing efficiency of the whole, not only to meet the accuracy requirements and can generate non scanning path interference but also high forming efficiency.

• Periodical: Key Engineering Materials (Volume 667)
• Pages: 82-87
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.667.82
• Online since: October 2015
• Authors: Zhan Li Wang, Yan Yan Chao, Yan Juan Hu
• Keywords: FDM, Fractal, Hilbert Curve, Scanning Path Planning

References

[1] Y. Yang, C.J. Song and L. Fei: Technology and Application of Automation, (2014) No. 12, pp.39-43. (In Chinese).

[2] Y. Liu, M. Hu, G.Y. Yu, X.B. Li and X.L. Liu: JiangXi Science, (2006) No. 02, pp.205-209. (In Chinese).

[3] MandelbortB B: The Fractal Geometry of Nature (Freeman, New York 1983).

[4] C. Pérez-Demydenko, I. Brito-Reyes, B. Aragón Fernández and E. Estevez-Rams: Applied Mathematics and Computation, (2014) p.234.

DOI: 10.1016/j.amc.2013.12.193

[5] N.T. Chen, N.C. Wang and Y. Chen: Micro computer system, (2005) No. 10, pp.1754-1757. (In Chinese).

[6] N.N. Zhang: Measurement and test technology, (2014) No. 07, pp.1-3. (In Chinese).

[7] Z.H. Wen and Y.F. Jiang: Research and development of computer, (2005) No. 10, pp.166-171. (In Chinese).

[8] B.D. You, C.C. Yi and Z.R. Ke: Journal of NanChang University, Vol. 30 (2008) No. 4, pp.381-384. (In Chinese).

[9] C.H. Sun: Mechanical science and technology, (2010), No. 03, pp.399-403. (In Chinese).