Key Engineering Materials Vols. 675-676

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Abstract: The study of photon interactions with matter is very important in many fields such as scientific, industry, medical imaging, biological applications, dosimetry, and radiation shielding for their potential use in radiation physics. Scintillating materials become a main part in detection and spectroscopy of high energy photons. The goal of this work is to study an interaction of 662 keV γ-rays with scintillating materials, namely the LYSO(Ce) and BGO crystals. The light output, energy resolution, intrinsic resolution, and photo-fraction of both crystals with the same size of 5x5x3 mm3 were measured using photomultiplier tube (PMT) readout. The result showed that the light yield of the LYSO(Ce) crystal is much more better than that of the BGO crystal, while its photo-fraction is worse than that of the BGO crystal.
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Abstract: In this paper we present the scintillation properties of polished Lu3Al5O12: Pr (LuAG: Pr) crystals grown by the Czochralski method. The light yield (LY) and energy resolution were measured using XP5200B photomultiplier under excitation with α - and γ-rays. High LY of 20,800 and 5,700 ph/MeV were obtained at 662 keV γ-rays and 5.5 MeV α-rays, respectively, for a 2 mm thick sample. Light yield dependences on sample thickness were measured under excitation with α - and γ-rays and the intrinsic LY and light loss coefficient were evaluated. The LY ratio under excitation with α - and γ-rays (α/γ ratio) was also determined.
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Abstract: The luminescence and gamma-ray detection properties of Gd2SiO5: Ce single crystal scintillator were investigated. The light yield (LY) and energy resolution were measured using R6231 photomultiplier. At 662 keV γ-rays, high LY of 10,300 photons /MeV and good energy resolution of 6.4 % were obtained. The intrinsic LY and light loss coefficient under excitation with 662 keV γ-rays were evaluated. The mass attenuation coefficient for 662 keV γ-rays was also measured by transmission method and compared with the theoretical value calculated by WinXCom program.
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