Intrinsic Light Yield and Light Loss Coefficient of LuAG: Pr under Excitation with α- and γ-Rays

Krittiya Sreebunpeng; WEERAPONG CHEWPRADITKUL; Martin Nikl

doi:10.4028/www.scientific.net/KEM.675-676.768

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Intrinsic Light Yield and Light Loss Coefficient of LuAG: Pr under Excitation with α- and γ-Rays

Abstract:

In this paper we present the scintillation properties of polished Lu₃Al₅O₁₂: Pr (LuAG: Pr) crystals grown by the Czochralski method. The light yield (LY) and energy resolution were measured using XP5200B photomultiplier under excitation with α - and γ-rays. High LY of 20,800 and 5,700 ph/MeV were obtained at 662 keV γ-rays and 5.5 MeV α-rays, respectively, for a 2 mm thick sample. Light yield dependences on sample thickness were measured under excitation with α - and γ-rays and the intrinsic LY and light loss coefficient were evaluated. The LY ratio under excitation with α - and γ-rays (α/γ ratio) was also determined.

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Periodical:

Key Engineering Materials (Volumes 675-676)

Pages:

768-771

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.675-676.768

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Online since:

January 2016

Authors:

Krittiya Sreebunpeng*, WEERAPONG CHEWPRADITKUL, Martin Nikl

Keywords:

Light Loss Coefficient, Light Yield, LuAG:Pr, Scintillation, α/γ Ratio

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