Application of the Method of X-Ray Fluorescence Analysis to Determine the Composition of Glassy and Crystalline Alloys of the Systems AsxS1-x and AsxSe1-x

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The article presents an X-ray fluorescence analysis of chalcogenide glassy semiconductors. The standard method is applied to determine the concentration of arsenic, selenium, and sulfur in alloys. This technique, the quantitative composition of the glasses is defined with an accuracy of ± 0.0002.

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97-103

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March 2020

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