The Stress Anomalies in TiAl: A Consequence of Mobile Dislocation Exhaustion

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Periodical:

Key Engineering Materials (Volumes 97-98)

Edited by:

Pavel Lukac

Pages:

195-200

DOI:

10.4028/www.scientific.net/KEM.97-98.195

Citation:

F. Louchet and B. Viguier, "The Stress Anomalies in TiAl: A Consequence of Mobile Dislocation Exhaustion", Key Engineering Materials, Vols. 97-98, pp. 195-200, 1994

Online since:

January 1995

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$35.00

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