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HomeMaterials Science ForumMaterials Science Forum Vols. 105-110Oxygen Microclusters in Quenched Si Studied by...

Oxygen Microclusters in Quenched Si Studied by Positron Annihilation

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Periodical:

Materials Science Forum (Volumes 105-110)

Pages:

1301-1304

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.105-110.1301

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Online since:

January 1992

Authors:

A. Ueodono, Yusuke Ujihira, Atsushi Ikari, O. Yoda

Keywords:

Doppler Broadening Profile, Lifetime, Microcluster, Oxygen, Quenching, Silicon

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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