Investigation of the Influence of Impurities on the Grain Boundary Relaxation in Thin Al-Films on Si-Substrates

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 119-121)

Edited by:

L.B. Magalas and S. Gorczyca

Pages:

273-278

DOI:

10.4028/www.scientific.net/MSF.119-121.273

Citation:

H.G. Bohn and C.M. Su, "Investigation of the Influence of Impurities on the Grain Boundary Relaxation in Thin Al-Films on Si-Substrates ", Materials Science Forum, Vols. 119-121, pp. 273-278, 1993

Online since:

January 1993

Authors:

Export:

Price:

$35.00

In order to see related information, you need to Login.