Effect of Oxygen on Segregation and Chemical Activity of Titanium in Ag-Cu Brazing Alloys
p.209
p.209
Tight-Binding Study ot Twist Boundaries in Silicon
p.213
p.213
Theoretical Study of the Atomic and Electric Structure of the {113 }Planar Interstitial Defects in Silicon
p.217
p.217
Geometric and Energetic Considerations for Grain Boundaries of Finite Extent
p.221
p.221
A New Semiempirical Method for Calculation of Segregation and Interfacial Energies of Metallic Systems
p.225
p.225
Grain Boundary Structure in NiO, Temperature Evolution: A Molecular Dynamics Study
p.229
p.229
A Modified Lennard-Jones Potential for the Relaxation of a Cu-AlN Interface
p.233
p.233
A Quasiperiodic Twin Description of General Grain Boundaries in Hexagonal Materials
p.237
p.237
Energy Calculation of the Σ = 5<001> Twist Grain Boundary in Silicon and Germanium
p.241
p.241
A New Semiempirical Method for Calculation of Segregation and Interfacial Energies of Metallic Systems
Abstract:
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Periodical:
Materials Science Forum (Volumes 126-128)
Pages:
225-228
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Online since:
January 1993
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© 1993 Trans Tech Publications Ltd. All Rights Reserved
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