Kinetics of Growing Oxide Layers Studied by Means of X-Ray Diffraction

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 133-136)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

563-568

Citation:

V. Kolarik et al., "Kinetics of Growing Oxide Layers Studied by Means of X-Ray Diffraction", Materials Science Forum, Vols. 133-136, pp. 563-568, 1993

Online since:

January 1993

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.