Long-Range Migration of Self-Interstitials Studied in Niobium by Dislocation Pinning and Resistivity Recovery

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Periodical:

Materials Science Forum (Volumes 15-18)

Edited by:

C. Abromeit and H. Wollenberger

Pages:

267-272

DOI:

10.4028/www.scientific.net/MSF.15-18.267

Citation:

J. Lauzier et al., "Long-Range Migration of Self-Interstitials Studied in Niobium by Dislocation Pinning and Resistivity Recovery", Materials Science Forum, Vols. 15-18, pp. 267-272, 1987

Online since:

January 1987

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$35.00

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