Trapping of Lattice Defects at 111In Atoms in Cold-Worked Copper

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Periodical:

Materials Science Forum (Volumes 15-18)

Edited by:

C. Abromeit and H. Wollenberger

Pages:

635-640

DOI:

10.4028/www.scientific.net/MSF.15-18.635

Citation:

M. Deicher et al., "Trapping of Lattice Defects at 111In Atoms in Cold-Worked Copper", Materials Science Forum, Vols. 15-18, pp. 635-640, 1987

Online since:

January 1987

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$35.00

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