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HomeMaterials Science ForumMaterials Science Forum Vols. 155-156Absolute Atomic Scale Measurements of the Gibbsian...

Absolute Atomic Scale Measurements of the Gibbsian Interfacial Excess of Solute at Grain Boundaries in an Iron (Silicon) Alloy

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Periodical:

Materials Science Forum (Volumes 155-156)

Pages:

393-396

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.155-156.393

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Online since:

May 1994

Authors:

B.W. Krakauer, David N. Seidman

Keywords:

Atom-Probe Field-Ion Microscopy, Equilibrium Segregation, Fe(Si), Gibbsian Interfacial Excess of Solute, Grain Boundary, Grain Boundary Degrees of Freedom, TEM

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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