X-Ray Texture Analysis in Films by the Reflection Method: Principal Aspects and Applications

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Periodical:

Materials Science Forum (Volumes 157-162)

Edited by:

H.J. Bunge

Pages:

1379-1386

DOI:

10.4028/www.scientific.net/MSF.157-162.1379

Citation:

D. Chateigner et al., "X-Ray Texture Analysis in Films by the Reflection Method: Principal Aspects and Applications ", Materials Science Forum, Vols. 157-162, pp. 1379-1386, 1994

Online since:

May 1994

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$35.00

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