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X-Ray Texture Analysis in Films by the Reflection Method: Principal Aspects and Applications
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Experimental Studies of Texture Development in Co-Cr Films
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Electric Field Induced Domain Formation in Surface Stabilized Ferroelectric Liquid Crystal Cells
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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162X-Ray Texture Analysis in Films by the Reflection...

X-Ray Texture Analysis in Films by the Reflection Method: Principal Aspects and Applications

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

1379-1386

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.1379

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Online since:

May 1994

Authors:

Daniel Chateigner, P. Germi, M. Pernet

Keywords:

Defocusing Correction, Film Texture Analysis, High-T_C Superconductor

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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