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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162Statistics, Evaluation and Representation of...

Statistics, Evaluation and Representation of Single Grain Orientation Measurements

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

259-274

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.259

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Online since:

May 1994

Authors:

Olaf Engler, Günter Gottstein, Jan Pospiech, J. Jura

Keywords:

Electron Backscattered Pattern (EBSP), Macrotexture, Microtexture, MODF, OCF, ODDF, Single Grain Orientation Measurements

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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