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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162Behaviour of Statistical Texture Parameters...

Behaviour of Statistical Texture Parameters Applied to Single Grain Orientation Measurements in Recrystallized Al-Mn

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

933-938

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.933

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Online since:

May 1994

Authors:

Olaf Engler, Ping Yang, Günter Gottstein, J. Jura, Jan Pospiech

Keywords:

Al-Mn, Electron Backscattered Pattern (EBSP), X-Ray Diffraction (XRD)

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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