Phase Transformation of NiTi Alloy Studied with an Inel X-Ray Position Sensitive Detector
p.147
p.147
Use of an X-Ray Imaging Plate for Stress Analysis
p.151
p.151
Use of an X-Ray Imaging Plate for Texture Measurements
p.157
p.157
Ring-Shape Distortion of the Pole Figure, caused by small Precession of the Sample during Data Acquisition
p.163
p.163
The Effect of Divergence Slit Configuration, Background Handling and Texture Effects on Quantitative Analysis of Amorphous and Crystalline SiO2-Fractions
p.169
p.169
Energy-Dispersive X-Ray Diffraction Analysis of the Structure of Disordered Materials
p.175
p.175
X-Ray Powder Diffraction at Temperatures up to 3000 K
p.181
p.181
PC Environment for Commonly used Programs in Powder Structure Refinement
p.187
p.187
Information-Calculating System on Crystal Structure Data of Minerals (MINCRYST)
p.193
p.193
The Effect of Divergence Slit Configuration, Background Handling and Texture Effects on Quantitative Analysis of Amorphous and Crystalline SiO2-Fractions
Abstract:
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Periodical:
Materials Science Forum (Volumes 166-169)
Pages:
169-174
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Online since:
July 1994
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© 1994 Trans Tech Publications Ltd. All Rights Reserved
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