The Effect of Divergence Slit Configuration, Background Handling and Texture Effects on Quantitative Analysis of Amorphous and Crystalline SiO2-Fractions

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Periodical:

Materials Science Forum (Volumes 166-169)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

169-174

DOI:

10.4028/www.scientific.net/MSF.166-169.169

Citation:

B. Ruedinger and R.X. Fischer, "The Effect of Divergence Slit Configuration, Background Handling and Texture Effects on Quantitative Analysis of Amorphous and Crystalline SiO2-Fractions", Materials Science Forum, Vols. 166-169, pp. 169-174, 1994

Online since:

July 1994

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$35.00

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