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HomeMaterials Science ForumMaterials Science Forum Vols. 166-169High Resolution X-Ray Diffraction Study of the...

High Resolution X-Ray Diffraction Study of the Strongly Defected Bi₄Sr₄CaCu₃O_x

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Periodical:

Materials Science Forum (Volumes 166-169)

Pages:

783-788

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.166-169.783

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Online since:

July 1994

Authors:

L.A. Novomlinski, B.Zh. Narymbetov, V.Sh. Shekhtman, A.A. Bush, S.A. Ivanov, V.V. Zhurov

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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