High Resolution X-Ray Diffraction Study of the Strongly Defected Bi4Sr4CaCu3Ox

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Periodical:

Materials Science Forum (Volumes 166-169)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

783-788

DOI:

10.4028/www.scientific.net/MSF.166-169.783

Citation:

L.A. Novomlinski et al., "High Resolution X-Ray Diffraction Study of the Strongly Defected Bi4Sr4CaCu3Ox", Materials Science Forum, Vols. 166-169, pp. 783-788, 1994

Online since:

July 1994

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$35.00

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