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HomeMaterials Science ForumMaterials Science Forum Vols. 173-174Laser-Aided Measurements of Electric Fields on...

Laser-Aided Measurements of Electric Fields on III-V Semiconductor Structures Using Modulation Spectroscopy: Solar Cell P-N Junctions and [111] Strained Layer Superlattices

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Semiconductor Processing and Characterization with Lasers

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Periodical:

Materials Science Forum (Volumes 173-174)

Pages:

355-0

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.173-174.355

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Online since:

September 1994

Authors:

R.G. Rodrigues, K. Yang, L.J. Schowalter, J.M. Borrego

Keywords:

Built-In Electric Field, Franz-Keldysh Oscillations, Modulation Spectroscopy, Optical Nonlinearity, Quantum Well, Solar Cell, Strain-Generated Electric Fields, Three-Beam Photoreflectance

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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