A Positron Annihilation Investigation of Defects in NTD FZ-Si Grown in Different Atmospheres

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Periodical:

Materials Science Forum (Volumes 175-178)

Edited by:

Yuan-Jin He, Bi-Song Cao and Y.C. Jean

Pages:

481-484

DOI:

10.4028/www.scientific.net/MSF.175-178.481

Citation:

W. Puff and X. T. Meng, "A Positron Annihilation Investigation of Defects in NTD FZ-Si Grown in Different Atmospheres", Materials Science Forum, Vols. 175-178, pp. 481-484, 1995

Online since:

November 1994

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$35.00

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