A Characterisation of Titanium Passivation Films by In-Situ AC Impedance Measurements and XPS Analysis

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Periodical:

Materials Science Forum (Volumes 192-194)

Edited by:

Mário Ferreira and Alda Simões

Pages:

177-184

DOI:

10.4028/www.scientific.net/MSF.192-194.177

Citation:

C. da Fonseca and M. da Cunha Belo, "A Characterisation of Titanium Passivation Films by In-Situ AC Impedance Measurements and XPS Analysis", Materials Science Forum, Vols. 192-194, pp. 177-184, 1995

Online since:

August 1995

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$35.00

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