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Probing Local Structure by Multi-Scattering EXAFS Data-Analysis: Application to Nanocrystalline Iron

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Periodical:

Materials Science Forum (Volume 195)

Pages:

127-132

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.195.127

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Cite this paper

Online since:

November 1995

Authors:

A. Di Cicco

Keywords:

Defect, EXAFS, GNXAS, Multiple Scattering, Structure

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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