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HomeMaterials Science ForumMaterials Science Forum Vols. 225-227Manufacture and Characterization of Nanocomposite...

Manufacture and Characterization of Nanocomposite Thin Films of Si-SiO₂ and Ag-Si

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Metastable, Mechanically Alloyed and Nanocrystalline Materials 1995

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Periodical:

Materials Science Forum (Volumes 225-227)

Pages:

175-178

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.225-227.175

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Online since:

July 1996

Authors:

I.T.H. Chang, F. Niu, D. Slimovici, C. Wildig, P.A. Leigh, P.J. Dobson, Brian Cantor

Keywords:

Ag-Si, Cosputtering, Nanocomposite, Si-SiO₂, TEM, UV-VIS, X-Ray Diffraction (XRD)

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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