Temperature Resolved X-Ray Diffraction of Ammonium Nitrate Evaluated with Rietveld Analysis

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Periodical:

Materials Science Forum (Volumes 228-231)

Edited by:

R.J. Cernik, R. Delhez and E.J. Mittemeijer

Pages:

359-362

DOI:

10.4028/www.scientific.net/MSF.228-231.359

Citation:

M. Herrmann and W. Engel, "Temperature Resolved X-Ray Diffraction of Ammonium Nitrate Evaluated with Rietveld Analysis", Materials Science Forum, Vols. 228-231, pp. 359-362, 1996

Online since:

July 1996

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$35.00

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