Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam

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Periodical:

Materials Science Forum (Volumes 255-257)

Edited by:

Y. C. Jean, Morten Eldrup, David M. Schrader, Roy N. West

Pages:

650-652

DOI:

10.4028/www.scientific.net/MSF.255-257.650

Citation:

G. Amarendra et al., "Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam", Materials Science Forum, Vols. 255-257, pp. 650-652, 1997

Online since:

September 1997

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$35.00

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