Paper Titles

Beam Switch System for Multi-Port Slow Positron Experiments
p.757

Fermi Surface Smearing Studied by 2D-ACAR and CP
p.760

The Effect of Resolution Function on Apparent Positronium Intensities
p.763

Development of High Performance Composites for Cryogenic Use - Application of Positron Annihilation Method -
p.766

Auger Line Shape Analysis by Time-of-Flight Positron-Annihilation Induced Auger-Electron Spectroscopy
p.769

Application of Maximum-Likelihood Method to Decomposition of Positron-Lifetime Spectra to Finite Number of Components
p.772

Cyclotron Production of ²⁰⁷Bi for the Calibration of Positron Lifetime Spectrometers
p.775

Slow Positron Target Concepts for the Advanced Photon Source (APS) Linear Accelerator
p.778

Development of Position Sensitive γ-Ray Detectors for 2D-ACAR Apparatus
p.781

HomeMaterials Science ForumMaterials Science Forum Vols. 255-257Auger Line Shape Analysis by Time-of-Flight...

Auger Line Shape Analysis by Time-of-Flight Positron-Annihilation Induced Auger-Electron Spectroscopy

Article Preview

Abstract:

You might also be interested in these eBooks

Positron Annihilation - ICPA-11

Info:

Periodical:

Materials Science Forum (Volumes 255-257)

Pages:

769-771

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.255-257.769

Citation:

Cite this paper

Online since:

September 1997

Authors:

Toshiyuki Ohdaira, Ryoichi Suzuki, Tomohisa Mikado, T. Yamazaki

Keywords:

Annihilation, Auger, Oxidation, PAES, Positron, Silicon, Surface, TOF

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1997 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: