Paper Titles

X-Ray Diffraction Studies of Highly-Condensed Matter
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Solution of Flexible Structures from Powder Diffraction Data Using a Simulated Annealing Technique
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Weighting Scheme for the Minimization Function in Rietveld Refinement and the Accuracy of Structural Parameters
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Phasing Crystal Structures from Powder Data: About the Use of the Harker Sections
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Crystal Structure Solution from Powder Diffraction Data by the Monte Carlo Method
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The Influence of User-Selected Models on the Results of the Rietveld Refinement of the LaOCl Structure
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Structure Solution from Powder Diffraction Data: Improvement of the Variances of the Extracted Integrated Intensities
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A New Method for High Accuracy QPA on Highly Textured Samples
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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281X-Ray Diffraction Studies of Highly-Condensed...

X-Ray Diffraction Studies of Highly-Condensed Matter

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

1-13

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.1

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Online since:

April 1998

Authors:

M.I. McMahon

Keywords:

High-Pressure, Image-Plate Detector, Powder Diffraction, Synchrotron Radiation (XRD)

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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