Structural Characterization of Cu Metallic Clusters in Amorphous SiO2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction

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Periodical:

Materials Science Forum (Volumes 278-281)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

891-897

DOI:

10.4028/www.scientific.net/MSF.278-281.891

Citation:

F. D'Acapito et al., "Structural Characterization of Cu Metallic Clusters in Amorphous SiO2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction", Materials Science Forum, Vols. 278-281, pp. 891-897, 1998

Online since:

April 1998

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