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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281Structural Characterization of Cu Metallic...

Structural Characterization of Cu Metallic Clusters in Amorphous SiO₂ by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction

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Periodical:

Materials Science Forum (Volumes 278-281)

Pages:

891-897

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281.891

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Online since:

April 1998

Authors:

F. D'Acapito, D. Thiaudière, F. Zontone, J.R. Regnard

Keywords:

Ion Implantation, Metallic Quantum Dots, Non-Linear Optical Materials, Small Angle X-Ray Scattering, X-Ray Diffraction (XRD)

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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