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HomeMaterials Science ForumMaterials Science Forum Vols. 308-311Examination of Si1-xGex Laterally Graded Crystals...

Examination of Si_1-xGe_x Laterally Graded Crystals for Use in High Brilliance Synchrotron Beams

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Functionally Graded Materials

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Periodical:

Materials Science Forum (Volumes 308-311)

Pages:

597-602

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.308-311.597

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Online since:

May 1999

Authors:

M. Veldkamp, A. Erko, F. Schäfers, W. Gudat, N.V. Abrosimov, Volker Alex, S. Rossolenko, V. Shekhtman, E. Shulakov, S. Khasanov, I. Smirnova

Keywords:

Laterally Graded Optics, Si_1-xGe_x Crystals, Synchrotron Radiation Instrumentation, X-Ray Diffraction (XRD)

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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