Examination of Si1-xGex Laterally Graded Crystals for Use in High Brilliance Synchrotron Beams

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Periodical:

Materials Science Forum (Volumes 308-311)

Edited by:

W.A. Kaysser

Pages:

597-602

DOI:

10.4028/www.scientific.net/MSF.308-311.597

Citation:

M. Veldkamp et al., "Examination of Si1-xGex Laterally Graded Crystals for Use in High Brilliance Synchrotron Beams", Materials Science Forum, Vols. 308-311, pp. 597-602, 1999

Online since:

May 1999

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$35.00

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