Scanning Thermo Probe Technique - A Method for High Resolution Characterization of Graded Semiconductors and Metals

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Periodical:

Materials Science Forum (Volumes 308-311)

Edited by:

W.A. Kaysser

Pages:

890-895

Citation:

P. Reinshaus et al., "Scanning Thermo Probe Technique - A Method for High Resolution Characterization of Graded Semiconductors and Metals", Materials Science Forum, Vols. 308-311, pp. 890-895, 1999

Online since:

May 1999

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