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HomeMaterials Science ForumMaterials Science Forum Vols. 315-317EXAFS Study of Defect Clusters of Highly Er3+...

EXAFS Study of Defect Clusters of Highly Er³⁺ Doped CaF₂ Thin Films

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Rare Earths '98

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Periodical:

Materials Science Forum (Volumes 315-317)

Pages:

394-399

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.315-317.394

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Online since:

July 1999

Authors:

T. Césaire, L. Hirsch, B. Porté, A.S. Barrière

Keywords:

Ca_1-xEr_xF_2+x, Erbium Environment, EXAFS, Thin Film

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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