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HomeMaterials Science ForumMaterials Science Forum Vols. 321-324Full Profile Analysis of X-Ray Powder Diffraction...

Full Profile Analysis of X-Ray Powder Diffraction Pattern of HCP Crystal with Stacking Faults

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Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

103-108

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.103

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Online since:

January 2000

Authors:

L.O. Olikhovska

Keywords:

Hexagonal Close-Packed Crystal, Orientation Correlation, Stacking Fault

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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