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HomeMaterials Science ForumMaterials Science Forum Vols. 347-349Stress in Thin Layers; Grain Interaction, Elastic...

Stress in Thin Layers; Grain Interaction, Elastic Constants and Diffraction Response

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Residual Stress ECRS 5

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Periodical:

Materials Science Forum (Volumes 347-349)

Pages:

42-47

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.347-349.42

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Online since:

May 2000

Authors:

Jan-Dirk Kamminga, Matteo Leoni, U. Welzel, P. Lamparter, Eric Jan Mittemeijer

Keywords:

Elastic Constant, Stress, Thin Film, X-Ray Diffraction (XRD)

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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