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HomeMaterials Science ForumMaterials Science Forum Vols. 384-385Determining the Antiferromagnetic Resonance...

Determining the Antiferromagnetic Resonance Frequency in Semimagnetic Semiconductors by Means of Surface Polaritons

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Ultrafast Phenomena in Semiconductors 2001

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Periodical:

Materials Science Forum (Volumes 384-385)

Pages:

273-278

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.384-385.273

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Online since:

January 2002

Authors:

N.N. Beletskii, S.A. Borysenko

Keywords:

Antiferromagnetic Resonance, ATR Method, Semimagnetic Semiconductors, Surface Polaritons

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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