Controlled Depth Penetration X-Ray Diffraction Measurement

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Periodical:

Materials Science Forum (Volumes 408-412)

Edited by:

Dong Nyung Lee

Pages:

233-238

Citation:

B. Bolle et al., "Controlled Depth Penetration X-Ray Diffraction Measurement", Materials Science Forum, Vols. 408-412, pp. 233-238, 2002

Online since:

August 2002

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Price:

$38.00

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