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HomeMaterials Science ForumMaterials Science Forum Vols. 408-412Effect of Grain Boundary Character on Selective...

Effect of Grain Boundary Character on Selective Growth of Goss Grain in Fe-3%Si Alloy

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Textures of Materials - ICOTOM 13

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Periodical:

Materials Science Forum (Volumes 408-412)

Pages:

973-978

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.408-412.973

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Online since:

August 2002

Authors:

Y. Ushigami, Satoshi Nakamura, S. Takebayashi, Shinya Suzuki

Keywords:

CSL, Electron Backscattered Pattern (EBSP), Secondary Recrystallization, Silicon Steel, Texture, X-Ray Topography

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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