Characterisation from μm to nm Scale for Interface Analysis

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Periodical:

Materials Science Forum (Volumes 426-432)

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Edited by:

T. Candra, Jose Maria Torralba and T. Sakai

Pages:

4203-4208

Citation:

S. Lay, "Characterisation from μm to nm Scale for Interface Analysis", Materials Science Forum, Vols. 426-432, pp. 4203-4208, 2003

Online since:

August 2003

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