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HomeMaterials Science ForumMaterials Science Forum Vols. 426-432Characterisation from μm to nm Scale for Interface...

Characterisation from μm to nm Scale for Interface Analysis

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THERMEC'2003

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Periodical:

Materials Science Forum (Volumes 426-432)

Pages:

4203-4208

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.426-432.4203

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Online since:

August 2003

Authors:

Sabine Lay

Keywords:

Grain Morphology, Interface, Segregation, WC-Co, W-Cu

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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