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HomeMaterials Science ForumMaterials Science Forum Vols. 445-446Embedded Ultrafine Clusters Investigated by...

Embedded Ultrafine Clusters Investigated by Coincidence Doppler Broadening Spectroscopy

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

11-15

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.11

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Online since:

January 2004

Authors:

Yasuyoshi Nagai, T. Toyama, Z. Tang, Masuyuki Hasegawa, S. Yanagita, Tadakatsu Ohkubo, Kazuhiro Hono

Keywords:

3D Atom Probe, Coincidence Doppler Broadening, Elemental Analysis by Positrons, Embedded Clusters, Positron Affinity Trapping

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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