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HomeMaterials Science ForumMaterials Science Forum Vols. 445-446Characterisation of Defects in Simulated...

Characterisation of Defects in Simulated Nanostructures

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

204-206

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.204

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Online since:

January 2004

Authors:

S. Van Petegem, Jan Kuriplach, Helena Van Swygenhoven, R. Meyer, Charles Dauwe, Danny Segers

Keywords:

Grain Boundary, Molecular Dynamic (MD), Nanocrystalline, Nickel Ni, Positron Lifetime Calculations, Vacancy Like Defects

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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