Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization

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Periodical:

Materials Science Forum (Volumes 475-479)

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Edited by:

Z.Y. Zhong, H. Saka, T.H. Kim, E.A. Holm, Y.F. Han and X.S. Xie

Pages:

9-20

DOI:

10.4028/www.scientific.net/MSF.475-479.9

Citation:

H. Saka "Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization", Materials Science Forum, Vols. 475-479, pp. 9-20, 2005

Online since:

January 2005

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$35.00

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