First Results of the DITO-Experiment at the HARWI II Beamline at GKSS/DESY

Bernd Hasse; Helene Rahn; Stefan Odenbach; Felix Beckmann; Walter Reimers

doi:10.4028/www.scientific.net/MSF.571-572.201

Paper Titles

Neutron Diffraction Study of Duplex Stainless Steel during Loading at 200°C
p.175

Single-Line Diffraction Profile Analysis Method Used for Evaluation of Microstructural Parameters in the Plain Ferritic Steel upon Tensile Straining
p.181

Improvements in Energy Dispersive Diffraction in Respect of Residual Stress Analysis
p.189

In Situ Investigation of the Deformation Behaviour of the Wrought Mg Base Alloy AZ31 Using Energy Dispersive Synchrotron Diffraction
p.195

First Results of the DITO-Experiment at the HARWI II Beamline at GKSS/DESY
p.201

Diffraction Contrast Tomography - A Synchrotron Radiation Technique for Mapping Polycrystalline Microstructures in 3D
p.207

Kowari – The Residual-Stress Diffractometer for Engineering Applications at OPAL
p.213

A Critical Discussion of the sin²ψ Stress Measurement Technique
p.219

Measurement of all Six Components of X-Ray Elastic Factors
p.225

HomeMaterials Science ForumMaterials Science Forum Vols. 571-572First Results of the DITO-Experiment at the HARWI...

First Results of the DITO-Experiment at the HARWI II Beamline at GKSS/DESY

Abstract:

At the HARWI II beamline at the GKSS outstation at DESY a new experiment for position sensitive diffractometry and tomography called DITO was built and commissioned this year. Due to the available high energy synchrotron radiation with photon energies up to 100 keV it is possible to investigate the bulk of metallic samples of a few mm thickness with both methods. The diffractometry detector allows the investigation of the phase composition as well as phase sensitive determination of residual stresses with a spatial resolution of 6 μm while the tomography detector can either measure a whole tomogram in high resolution mode with a spatial resolution of 2 μm within 3 to 4 hours or in high speed mode recording a whole tomogram within 15 seconds with a spatial resolution of 40 μm.