This paper presents a systematic study about ceramics made of zirconium oxide and titanium oxide (ZrO2-TiO2) doped with tin oxide (SnO2), strontium oxide (SrO2) and niobium oxide (Nb2O5). These ceramics can be applied as dielectric resonators in microwave systems for telecommunications. For a good microwave performance, these ceramics must reach some parameter values as high dielectric constant and high quality factor due to the dielectric losses. The ceramics were manufactured using suitable powder mixtures of ZrO2-TiO2 with additions of 1 % of SnO2, SrO2 and Nb2O5, resulting in four different kinds of samples for analysis. The samples were compacted by an uniaxial (190 MPa) and an isostatic (300 MPa) pressing, sintered at 1200 °C for 3 hours, characterized in the chemical compound formation using X-ray Diffraction (XRD) and scanned for microstructure densification degree and grain distribution analysis in Scanning Electron Microscopy (SEM). The dielectric parameters were measured using a microwave system. The main goal of present procedure is manufacture ceramic materials for promising application as dielectric resonators.